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Probe Card Product List and Ranking from 8 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Probe Card Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 日本電子材料 Hyogo//Electronic Components and Semiconductors
  2. コーヨーテクノス Nagano//Testing, Analysis and Measurement
  3. アポロウエーブ　 本社 Osaka//Testing, Analysis and Measurement
  4. 4 兼松ＰＷＳ Kanagawa//Industrial Machinery
  5. 4 理化電子 Osaka//Electronic Components and Semiconductors
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Probe Card Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. Probe card for semiconductor testing. 日本電子材料
  2. Koyo Technos TAB/COF Inspection Probe Card コーヨーテクノス
  3. VBPC(Vertical Bending Probe Card） コーヨーテクノス
  4. Kanesho PWS Corporation Business Introduction 兼松ＰＷＳ
  5. 4 Apollo Wave Inc. Business Introduction アポロウエーブ　 本社

Probe Card Product List

1～11 item / All 11 items

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Probe card for semiconductor testing.

Probe card for semiconductor testing.

A probe card that excels at simultaneously measuring a large number of microchips created on a semiconductor wafer.

The "probe card" is used in the semiconductor manufacturing process during the electrical inspection known as wafer testing. Our flagship product, the "Advanced Probe Card (M-type Probe Card)," excels at simultaneously measuring a large number of microchips created on semiconductor wafers. It is used for testing DRAM and NAND flash memory, which are also incorporated in smartphones. 【Features】 ■ Excellent at simultaneously measuring a large number of microchips ■ Usable for testing DRAM and NAND flash memory ■ Incorporates advanced technology known as MEMS *Please feel free to contact us.

  • Inspection fixture
  • Semiconductor inspection/test equipment

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TOTAL TEST SOLUTION Co., Ltd. - Company Information

TOTAL TEST SOLUTION Co., Ltd. - Company Information

Towards the future of manufacturing, creating new value - TOTAL TEST SOLUTION Seiken Co., Ltd.

Our company is a manufacturer that has developed and designed inspection equipment essential for quality assurance. Since our establishment in 1984, we have started manufacturing and selling probe pins and various inspection jigs as a specialized manufacturer. Since then, we have responded to customer demands in various markets, including semiconductor component inspection jigs such as probe cards and IC sockets, as well as LCD panel inspection jigs. As a leading company in the industry, we have refined and honed our precision processing and assembly technology over many years. Keeping pace with the changes of the times, we will continue to be a good partner for our customers as a "TOTAL TEST SOLUTION" provider, tackling challenges in inspection operations with various products and services. In recent years, we have also been providing the technologies and know-how we have accumulated in producing our products through our EMS business. In addition to our unique skills, we also provide various support in manufacturing through matching customers with our partner companies and related firms. Seiken will always challenge itself, create new value, and pave the way for the future of Japanese manufacturing.

  • Semiconductor inspection/test equipment

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VBPC(Vertical Bending Probe Card）

VBPC(Vertical Bending Probe Card）

VBPC(Vertical Bending Probe Card）

Utilizing the deflection caused by the vertical stroke of the wire as contact load, this is a fixture for substrate inspection. The "VBPC" is a probe made from ultra-fine wires such as tungsten, which have been specially plated and coated with Teflon, and it uses the deflection from the vertical stroke of the wire for contact load in substrate inspection. 【Features】 ◆ Tip plate material: Engineering plastic / Ceramic ◆ Pin position accuracy: ±5 ◆ Pin height variation: ±10 ◆ Pin tip shape: Round / Needle / Flat ■□■□■□■□■□■□■□■□■□■□■□■□ ＝＝＝＝＝ Please contact us for more details＝＝＝＝＝

  • Other semiconductor manufacturing equipment

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Koyo Technos TAB/COF Inspection Probe Card

Koyo Technos TAB/COF Inspection Probe Card

We promise to improve inspection efficiency!

Our company's probe has received high acclaim both domestically and internationally.

  • Semiconductor inspection/test equipment

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W-CSP inspection probe card

W-CSP inspection probe card

W-CSP inspection probe card

Probe card for inspecting W-CSP (WLCSP) with balls implemented at the wafer level 【Features】 ○ User-friendly customization (including probe pins) ○ High maintainability ○ High durability performance accumulated by probe pins For more details, please contact us.

  • Semiconductor inspection/test equipment
  • Other semiconductors
  • Printed Circuit Board

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Kanesho PWS Corporation Business Introduction

Kanesho PWS Corporation Business Introduction

Leave it to us for technical consulting in semiconductor, LCD, and electronic component manufacturing!

Kanematsu PWS Corporation is a company primarily engaged in the development, design, manufacturing, and sales of semiconductor manufacturing and inspection equipment. Our main products include equipment-related units and parts such as "wafer probe cards," "polishing films," and "Post CMP Blush." In addition, we provide technical services such as the design and manufacturing of various labor-saving devices, installation and maintenance of our own equipment, and imported semiconductor manufacturing and inspection equipment. Please feel free to contact us if you have any requests. 【Business Introduction】 ■ Development, design, manufacturing, and sales of semiconductor manufacturing/inspection equipment ■ Technical services ■ Sales, brokerage, maintenance services, setup, and modification of used semiconductor manufacturing equipment *For more details, please refer to our catalog or feel free to contact us.

  • Wafer
  • Contract manufacturing
  • Other electronic parts

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Koyo Technos manufactured probe guard for semiconductor wafer inspection.

Koyo Technos manufactured probe guard for semiconductor wafer inspection.

High-speed multi-inspection has become possible.

The vertical probe VBP-C method enables high-speed multi-testing.

  • Semiconductor inspection/test equipment

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Apollo Wave Inc. Business Introduction

Apollo Wave Inc. Business Introduction

We provide solutions for semiconductor measurement!

Apollo Wave Co., Ltd. is a company primarily engaged in the manufacturing and sales of various types of probe cards. We handle manual probers that accommodate chip sizes up to 300mm wafers, as well as high-frequency probe cards and DC multi-contact probes that strongly support the upcoming era of wafer testing. Focusing on high frequency, temperature, and microcurrent, we contribute to cost reduction through wafer-level inspection. 【Business Activities】 ■ Manufacturing and sales of various probe cards ■ Manufacturing and sales of manual probers and hot chucks *For more details, please refer to our catalog or feel free to contact us.

  • Other inspection equipment and devices

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RF probe card (high-frequency probe card)

RF probe card (high-frequency probe card)

RF probe card (high-frequency probe card)

RF Probe Card (High-Frequency Probe Card) Frequency / Specs / Maximum RF Pin Count - DC-10GHz / IL<1.5dB RL>15dB / 8 - DC-10GHz / IL<3dB RL>10dB / 32 - DC-40GHz / IL<1.5dB RL>18dB / GSG, GSGSG, etc. specified Features - No initial cost required - Short delivery time - High durability - Chip components can be mounted on the needle tip - Circuit fabrication on PCB For more details, please contact us.

  • Tester

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